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dc.contributor.authorSHARMA, PIYUSH-
dc.date.accessioned2017-09-28T10:59:37Z-
dc.date.available2017-09-28T10:59:37Z-
dc.date.issued2017-07-
dc.identifier.urihttp://dspace.dtu.ac.in:8080/jspui/handle/repository/15998-
dc.description.abstractThe motivation of this work depends upon two major drawbacks of conventional MOSFET. One of them is small sub threshold swing and the other major drawback is power consumption. As we are moving towards Nano scale devices, it is mandatory for us to handle these major problems, so we introduced a new FET device with band to band tunneling phenomenon. The history of tunnel FET is shown in the introduction.en_US
dc.language.isoenen_US
dc.relation.ispartofseriesTD-2979;-
dc.subjectGATE-DOUBLEen_US
dc.subjectGATE TUNNEL FETen_US
dc.subjectMOSFETen_US
dc.titleSTUDY OF DUAL MATERIAL GATE-DOUBLE GATE TUNNEL FETen_US
dc.typeThesisen_US
Appears in Collections:M.E./M.Tech. Applied Physics

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